This volume addresses the issues related to hot-carrier reliability of MOS VLSI circuits, ranging from device physics to circuit design guidelines. It presents a unified view of the physical mechanisms involved in hot-carrier induced device degradation, the prevalent models for these mechanisms, and simulation methods for estimating hot-carrier effects in the circuit environment. The newly Read more
Archive : Computer
[OFFER] Matching Properties of Deep Sub-Micron MOS Transistors (The Springer International Series in Engineering and Computer Science) Reviews
Matching Properties of Deep Sub-Micron MOS Transistors examines this interesting phenomenon. Microscopic fluctuations cause stochastic parameter fluctuations that affect the accuracy of the MOSFET. For analog circuits this determines the trade-off between speed, power, accuracy and yield. Furthermore, due to the down-scaling of device dimensions, transistor mismatch has an increasing impact on digital circuits. The Read more
[OFFER] Operation and Modeling of the MOS Transistor (Oxford Series in Electrical and Computer Engineering)
Operation and Modeling of the MOS Transistor has become a standard in academia and industry. Extensively revised and updated, the third edition of this highly acclaimed text provides a thorough treatment of the MOS transistor–the key element of modern microelectronic chips. New to this edition: * Energy bands and the energy barrier viewpoint are integrated Read more